Optical waveguide appearance defect inspection equipment is mainly used to inspect the appearance defects of transparent materials such as various types of optical waveguides, optical glass, etc. This machine is equipped with a combined light source and a high-resolution optical system, using optical imaging technology, combined with traditional image processing algorithms and deep learning algorithms to efficiently and accurately inspect defects on the upper and lower surfaces of various transparent materials.; Strong versatility, compatible with waffle tray and wafer expander ring loading and unloading; Multi-ejector pin design flexibly adapts to product testing of different sizes and specifications; 4-channel inspection stations, high degree of equipment automation, can effectively replace manual inspection, improve production efficiency and product quality.

Wafer appearance defect inspection equipment is used for appearance defect inspection of wafers before and after cutting.

Cencorp 1200AW is used for surface macro defect inspection of wafer and substrate/post die bonding during the semi-conductor assembly and test stage. It supports automatic loading and unloading of 8-inch/12-inch wafer and substrate/post die bonding device, and is manually compatible with surface macro defect inspection of 12-inch wafer after dicing and single chip.

Optoelectronic chip 4-sided inspection & sorting equipment (1500AD) is used to inspect the appearance defects on the P/N/AR/HR surfaces of optoelectronic chip.